Agilent Manuals

The Application Note describes the application of accurate mass measurement using the ESI TOF technology, and gives mean and standard deviation of repeatedly measured mass accuracies from a real-life pharmaceutical sample.

This Application Note describes the identification of pharmaceutical metabolites using the Agilent 6520 Accurate-Mass Quadrupole Time-of-Flight (Q-TOF) LC/MS system and Agilent MassHunter Metabolite Identification (MetID) software.

This article describes how to use Agilent ZORBAX Eclipse Plus Phenyl-Hexyl and StableBond Phenyl columns to separate potentially harmful azo dye amines

This document introduces Agilent Technologies' Scanning Microwave Microscope (SMM), a new Scanning Probe Microscope (SPM) that combines the electromagnetic measurement capabilities of a microwave Vector Network Analyzer (VNA) with the nanometer-resolution and Angstrom-scale positioning capabilities of an Atomic Force Microscope (AFM). Agilent VNAs are mature, highly sophisticated characterization instruments that make extremely accurate, calibrated measurements of complex-valued ratios on electromagnetic signals. This measurement capability, delivered to the apex of an AFM tip makes the SMM the only SPM in its class, enabling calibrated, traceable measurements of electrical properties such as impedance and capacitance, with the high spatial resolution.

This article introduces the application of carbon nanotube tips in MAC mode AFM measurements in liquids. Carbon nanotube tips, with sharp geometry, intrinsic electrical conductivity, and mechanical resilience, offer a solution to the common tip-wear problem and have been successfully demonstrated in lithographic oxidation of hydrogen-passivated silicon surfaces.

MAC Mode Atomic Force Microscope for Precision Interfacial Force Measurements

This application note presents a primer on the direct and reverse piezoelectric effects and their uses, and the instrumentation and applications of piezoresponse force microscopy.

This application note introduces the basic principle and applications of fluorescence microscopy, as well as the features and advantages of Agilent fluorescence microscopes.

This document presents a practical example of backflushing using the Agilent QuickSwap accessory for analyzing polychlorinated biphenyls (PCBs) in waste oil. The benefits of using QuickSwap instead of the traditional high-temperature bakeout procedure are demonstrated, including significantly reduced column and detector contamination and increased sample throughput.

The Scanning Microwave Microscope Mode is a new scanning probe microscope (SPM) that combines the electromagnetic measurement capabilities of a microwave vector network analyzer (VNA) with the nanometer-resolution and Angstrom-scale positioning capabilities of an Atomic Force Microscope (AFM).

This application note describes how to use Agilent ZORBAX Rapid Resolution High Throuhput (RRHT) Eclipse Plus Phenyl-Hexyl column for high-resolution analysis of 13 taxane derivatives. Improved silica, endcapping, and bonding technology, as well as the molecular interactions of the phenyl-hexyl moiety with the conjugation within the taxane derivatives, make the Eclipse Plus Phenyl-Hexyl column an ideal choice for this RRHT taxane method.

This Application Note describes the methods for metabolite identification using the different scan modes available with the Agilent 6410B Triple Quadrupole LC/MS system, as well as the use of the Agilent 1200 Series Rapid Resolution LC (RRLC) system for separation of compounds in complex mixtures on Agilent ZORBAX Rapid Resolution High Throughput (RRHT) columns with 1.8 µm particle size. It also discusses the use of the Agilent MassHunter Workstation software for data acquisition and qualitative data analysis.

This application illustrates the improvement in run-to-run response robustness in a biological sample using the pressure-controlled tee (PCT) arrangement.

This note describes a rapid IgM quantification method for cell culture product and purification process monitoring using the Agilent Bio-Monolith QA column.

This article describes a simple, robust and reliable method for the measurement of 21 trace elements in high-purity ammonium paratungstate (APT) using an Agilent 7500cx ICP-MS fitted with a High Matrix Introduction (HMI) system. HMI is a new sample-introduction accessory specially designed for concentrated samples with high total dissolved solids (TDS). Comparing results obtained using different APT sample digestion methods shows that dissolving the material in heated 4% H2O2 minimizes the formation of interferences on difficult elements such as phosphorus and silicon. APT samples containing 1% TDS were analyzed directly using the HMI's ultra robust mode. Results were calculated using the method of standard addition (MSA). Interferences on challenging elements such as Ca, K, Fe, and Si were removed by the Octopole Reaction System (ORS), a standard component of the Agilent 7500cx. The short turnaround time, including sample preparation and analy- sis time, indicates that the method is suitable for onsite testing.