Xilinx Platform Flash PROMs Datasheet

This document describes the features and characteristics of Xilinx's programmable PROMs products, including low-power advanced CMOS NOR Flash process, high endurance, and operation over the full industrial temperature range.


Xilinx Platform Flash PROMs Datasheet - cover page
Brand
Xilinx
Category
Other device
Document type
Datasheet
Language
English
Pages
35
File format
PDF
File size
1 MB
Published
07 May, 2012
Updated
28 September, 2023
MD5 checksum
0CDEB4DD9B2C92269FAEE430F59A397F

About this manual

The Xilinx Platform Flash series provides in‑system programmable NOR flash devices for FPGA configuration, available in densities from 1 Mb to 32 Mb. The family includes 3.3 V XCFxxS parts (1‑4 Mb) and 1.8 V XCFxxP parts (8‑32 Mb) with serial, parallel, and SelectMAP interfaces.

The devices support IEEE 1149.1/1532 boundary‑scan, JTAG‑based in‑system programming, design revisioning, built‑in data decompression, and optional security features such as read‑protect and write‑protect bits. Electrical characteristics, timing parameters, and TAP specifications are detailed for reliable integration.

What's inside

  • Features
  • Device Overview
  • Programming
  • Design Security
  • IEEE 1149.1 Boundary‑Scan (JTAG)
  • Instruction Register
  • Boundary‑Scan Register
  • Identification Registers
  • TAP Characteristics
  • Additional Features for the XCFxxP

Specifications

Endurance20,000 program/erase cycles
Data Retention≥20 years

Frequently asked questions

How many program/erase cycles are guaranteed for these devices?

The devices guarantee an endurance of 20,000 program/erase cycles.

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