Xilinx XC5200 Series FPGA Product Specification

This is an introduction to the Xilinx XC5200 FPGA product. It introduces the main features, performance, functions, application scenarios of this product.


Xilinx XC5200 Series FPGA Product Specification - cover page
Brand
Xilinx
Category
Other Electronics
Document type
Datasheet
Language
English
Pages
74
File format
PDF
File size
587 KB
Published
01 June, 2012
Updated
01 October, 2023
Model
XC5200
MD5 checksum
A5FFDDBFC0FB563B1EE49CDE9407F82D

About this manual

The XC5200 Series Field‑Programmable Gate Arrays are low‑cost, SRAM‑based devices built on a 0.5 µm three‑layer metal CMOS process. They offer 256 to 1,936 logic cells (3,000 to 23,000 gates), system performance beyond 50 MHz, and a rich hierarchy of interconnect resources including six levels of routing hierarchy and the VersaRing I/O interface.

The architecture combines Configurable Logic Blocks (CLBs) with a Local Interconnect Matrix and direct connects to form VersaBlocks. Each CLB contains four Logic Cells with dedicated carry logic, three‑state buffers, and optional flip‑flops or latches. The I/O pins provide programmable slew‑rate control, 8 mA source/sink capability, and built‑in IEEE 1149.1 JTAG boundary‑scan test circuitry.

What's inside

  • Features
  • Description
  • XC5200 Family Compared to XC4000/Spartan™ and XC3000 Series
  • Configurable Logic Block (CLB) Resources
  • Input/Output Block (IOB) Resources
  • Routing Resources
  • Performance Overview
  • Global Reset

Specifications

Logic Cells256 to 1,936
Process Technology0.5 µm three‑layer metal CMOS
Maximum Clock SpeedBeyond 50 MHz (benchmarked >66 MHz)
I/O Pin Current8 mA source and sink
JTAG Boundary ScanBuilt‑in IEEE 1149.1 support on all I/O pins
Global BuffersFour per device

Frequently asked questions

How many logic cells are available in XC5200 devices?

Devices range from 256 to 1,936 logic cells.

What current can each I/O pin source or sink?

Each I/O pin can source and sink up to 8 mA.

Does the XC5200 support JTAG boundary‑scan testing?

Yes, it includes built‑in IEEE 1149.1 JTAG boundary‑scan test circuitry on all I/O pins.

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