MITSUBISHI ELECTRIC SEMICONDUCTOR MGF0921A RF TEST DATA for Freq.=1.85-1.95GHz BAND Manual

This document shows the RF characteristics data of MGF0921A, including frequency range, power output, and input power.


MITSUBISHI ELECTRIC SEMICONDUCTOR MGF0921A RF TEST DATA for Freq.=1.85-1.95GHz BAND Manual - cover page
Brand
Mitsubishi
Category
Other Electronics
Document type
Datasheet
Language
English
Pages
4
File format
PDF
File size
120 KB
Published
21 March, 2012
Updated
28 September, 2023
MD5 checksum
01D799260ABC5A02A38CF743B93B82E7

About this manual

The document presents measured RF characteristics of the MGF0921A semiconductor under defined test conditions. It includes power output, ACLR, IM3/IM5 performance and an equivalent circuit model.

A test fixture description and component values for the measurement board are also given, along with the test voltage, bias current and temperature settings used during the evaluation.

What's inside

  • Summary
  • Sample history
  • Evaluate conditions
  • Results
  • Equivalent Circuit
  • Test Fixture

Specifications

Frequency band1.85‑1.95 GHz
Test bias current (IDQ)0.5 A
Test temperature (Tc)25 °C
Board materialFR4, 0.8 mm thickness
Dielectric constant4.4
Capacitor values (C1‑C4)20 pF each

Frequently asked questions

What bias current is applied during testing?

A bias current of 0.5 A (IDQ=0.5A) is used.

At what temperature are the RF tests conducted?

The device is tested at 25 °C (Tc=25deg.C).

What is the substrate material and its dielectric constant?

The test board is made of FR4 with a dielectric constant of 4.4.

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