This application note shows the reliability concept and reliability level for Silicon RF products.
This application note presents Mitsubishi Electric's reliability concept for its silicon RF power semiconductor products. It outlines the target quality level, estimated walkie‑talkie operating time, standard reliability test items, and conceivable failure modes.
The document includes detailed reliability test results for the RA series devices (e.g., RA45H4452M, RA13H8891MB, RAO7M1317M) under high‑temperature, low‑temperature, humidity, and RF operation conditions, as well as the corresponding failure criteria and failure mode analyses.
| Initial Failure Rate | 1000 ppm |
|---|---|
| Failure in Time | 1000 FIT |
| Operating time (walkie‑talkie) | 8.5 hours/day |
| Lifetime (walkie‑talkie) | 5 Years (93.075 cycles) |
| High temperature test condition | 125 °C for 1000 h |
| Low temperature test condition | -40 °C for 1000 h |
| Humidity test condition | 85 °C, 85 %RH for 1000 h |
The initial failure rate is specified as 1000 ppm.
The walkie‑talkie is estimated to operate 8.5 hours per day and have a lifetime of 5 years (about 93,075 cycles).
The device is tested at 125 °C for 1000 hours.