Toshiba TPC8301 P-Channel MOSFET Datasheet

TPC8301 is a P-channel MOSFET produced by Toshiba. It is mainly used in lithium-ion batteries, portable devices and notebook computers. The product has the characteristics of small size, low RDS(ON), high Yfs and low IDSS.


Toshiba TPC8301 P-Channel MOSFET Datasheet - cover page
Brand
Toshiba
Category
Other Electronics
Document type
Datasheet
Language
English
Pages
7
File format
PDF
File size
422 KB
Published
07 June, 2012
Updated
30 September, 2023
MD5 checksum
D8BCFD7BA7BC4085EE6AAA4842B95428

About this manual

This document is a technical datasheet for the Toshiba TPC8301 Field Effect Transistor. It describes a Silicon P Channel MOS Type device specifically designed for Lithium Ion Battery Applications and Portable Equipment Applications, such as Notebook PCs.

The datasheet provides comprehensive electrical characteristics including maximum ratings, thermal resistance values, and switching times. Key specifications highlight a low drain-source ON resistance of 95 mΩ typical and a small footprint due to the SOT-23 package.

What's inside

  • Lithium Ion Battery Applications
  • Portable Equipment Applications
  • Maximum Ratings
  • Thermal Characteristics
  • Electrical Characteristics
  • Source-Drain Ratings and Characteristics
  • Safe Operating Area

Specifications

Drain-source voltage (Vdss)-30 V
Gate threshold voltage (Vth)-0.8 ~ -2.0 V
Drain-source ON resistance (Rds(on))95 mΩ typ.
Forward transfer admittance (Yfs)4S typ.
Channel temperature (Tch)150 °C

Frequently asked questions

What are the primary applications for this transistor?

This device is intended for Lithium Ion Battery Applications and Portable Equipment Applications, such as Notebook PCs.

What is the typical drain-source ON resistance?

The typical drain-source ON resistance (Rds(on)) is 95 mΩ.

Is this device suitable for high-reliability safety equipment?

No, the product is not intended or warranted for usage in equipment that requires extraordinarily high quality and reliability where failure may cause loss of human life.

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