Fairchild Semiconductor AN-9067 Analysis of MOSFET Failure Modes in LLC Resonant Converter Application Note

This application note discusses potential failure mode and mechanism in LLC resonant converters and provides a simple and cost-effective solution to prevent failures.


Fairchild Semiconductor AN-9067 Analysis of MOSFET Failure Modes in LLC Resonant Converter Application Note - cover page
Brand
Fairchild
Category
Other Electronics
Document type
Application Note
Language
English
Pages
12
File format
PDF
File size
1.5 MB
Published
12 July, 2012
Updated
30 September, 2023
MD5 checksum
4ECAF029FFA2535A0C346E86002F0410

About this manual

The document discusses the trend towards increasing power densities in switched-mode power supplies (SMPS) by utilizing high-frequency switching topologies like Zero-Voltage-Switching (ZVS). It highlights that while LLC resonant half-bridge converters offer benefits such as wide output regulation and guaranteed ZVS, they require MOSFETs with fast reverse-recovery body diodes to ensure reliability.

The text details specific failure modes associated with these converters, particularly during the startup phase. It explains how empty capacitances at startup cause higher reverse recovery currents in the low-side switch's body diode, leading to shoot-through problems when the high-side switch turns on. This can result in device breakdown due to high dv/dt stress.

What's inside

  • Abstract
  • Introduction
  • LLC Resonant Half-Bridge Converter
  • Failure Modes in LLC Resonant Converter
  • Startup Failure Mode

Frequently asked questions

What specific failure mechanism occurs in LLC resonant converters during startup?

A large shoot-through current flows due to the reverse-recovery current of the low-side MOSFET's body diode, which can break down the device.

What characteristic of the MOSFET body diode is required to prevent these failures?

The application requires a MOSFET with a fast reverse-recovery body diode to ensure better reliability.

Under what operating conditions do unexpected failures associated with shoot-through current occur?

Unexpected failures can occur during startup, overload, and output short circuit conditions.

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