This article introduces the evolution of scanning probe microscopes in biological imaging
The document provides an overview of the history of scanning probe microscopy, starting with the Scanning Tunneling Microscope (STM) and evolving into the Atomic Force Microscope (AFM). It highlights how AFM overcomes limitations of STM by being able to image non-conductive materials like biological samples.
AFM is able to image non-conductive or insulating materials, such as proteins, DNA, and living cells.
Physical interactions in contact mode create significant lateral force, so samples must be firmly affixed to an atomically flat substrate.
AC AFM encounters negligible lateral forces, making it a gentler technique that prevents severe sample degradation.