This article discusses the use of atomic force microscopy (AFM) to probe the three-dimensional structure of soft organized surfactants at the solid-liquid interface. By utilizing Agilent Technologies' MAC Mode, precise control of the oscillation of a magnetically coated AFM cantilever is achieved, enabling imaging with an average force below 1 pN and minimizing distortion of soft molecules.
Atomic force microscopy (AFM) is used to study the three-dimensional structure of adsorbed surfactants on solid surfaces. Standard contact mode often results in compressed images because the applied force is too high for soft molecules.
Agilent Technologies introduces MAC Mode, which enables precision control of a magnetically coated AFM cantilever's oscillation. This allows imaging with an average force well below 1 pN, minimizing distortion and providing more realistic topography structures of surfactant aggregates.
The DTAB solution was diluted to 40 mM, which is about three times the critical micelle concentration.
Some cylinders were measured clearly above 2 nm, which is about half of the estimated aggregate height.