Agilent 5500 AFM Oxygen-Free High-Resolution Electrochemical SPM Application Note

This application note thoroughly characterizes the oxygen-elimination capability of the standard environmental chamber of the Agilent 5500 AFM. The note provides measurements of liquid imaging and atomic resolution in oxygen-free environment. The well-known transition between Au (1 x 1) atomic lattice and Cu (√3 x √3) under potential deposition (UPD) structure on Au (111) surface at different electrochemical potentials is demonstrated with the in situ high-resolution capability.


Agilent 5500 AFM Oxygen-Free High-Resolution Electrochemical SPM Application Note - cover page
Brand
Agilent
Category
Other Electronics
Document type
Application Note
Language
English
Pages
4
File format
PDF
File size
1.1 MB
Published
02 July, 2012
Updated
01 October, 2023
MD5 checksum
B54B8875AEBCB2D6A02D9A0AD5DA269D

About this manual

This document characterizes the oxygen-elimination capability of the standard environmental chamber of the Agilent 5500 AFM. It details the setup using a TPI 708 oxygen analyzer and high-purity nitrogen gas to reduce oxygen concentrations to below 0.1%.

What's inside

  • Introduction
  • Experiment
  • Oxygen characterization
  • Reductive desorption of alkanethiol SAMs
  • High-resolution in situ EC SPM
  • Conclusion

Frequently asked questions

How long does it take to reduce the oxygen concentration in the chamber from ambient levels to below 0.1%?

It takes less than 5 minutes of continuous nitrogen purge at a pressure of 10 to 20 psi.

How long must the nitrogen flow continue after reaching low oxygen levels to keep the chamber stabilized?

An additional 15-minute purge is needed to reach a level where oxygen is not detectable.

How long can the chamber remain oxygen-free if the nitrogen flow is stopped?

Oxygen becomes detectable again after 20 to 30 minutes once the nitrogen flow stops.

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