This document is a reliability data report for AT29C020 Programmable Read-Only Memory (PEROM), including dynamic operating life test, high temperature retention bake, cycle test, etc. The product is characterized by high reliability and stability.
This document presents the reliability data for the Atmel AT-29C020 EEPROM obtained from a series of accelerated life tests. It includes results from dynamic operating life tests at 125 °C, high‑temperature retention bakes, pressure‑pot tests, humidity exposure, extended temperature cycling and thermal shock.
Key findings show very low failure rates across all test conditions, with detailed device‑hour totals and confidence estimates for each test. The data are intended for engineers assessing long‑term performance and qualification of the AT‑29C020 in harsh environments.
| Failure Rate (125 °C Dynamic Test) | 0.8% per 1,000 hours |
|---|---|
| Failure Rate (200 °C Retention Bake) | 0.33% per 1,000 hours |
| Temperature range for extended cycling | -65 °C to +150 °C |
The failure rate is 0.8% per 1,000 hours.
The test cycles from –65 °C up to +150 °C.
210,000 device hours were recorded.
The failure rate is 0.33% per 1,000 hours.