This article introduces a flexible analytical tool for directly analyzing the trace element content of solid samples. Laser ablation inductively coupled plasma mass spectrometry (LA-ICP-MS) enables identification and comparison of physical evidence, discriminating elemental and isotopic differences at the part per billion (ppb) level.
This document introduces Laser Ablation Inductively Coupled Plasma Mass Spectrometry (LA-ICP-MS) as a flexible, micro-destructive analytical tool for forensic scientists. It highlights the technique's ability to determine the origin of inorganic materials by identifying elemental and isotopic differences at the part per billion level without destroying significant amounts of evidence.
The text details a specific application using a Merchantek UP-213 LA system coupled to an Agilent 7500s ICP-MS. It covers the operational principles, including the use of a 213 nm Nd:YAG laser, sample preparation requirements, and calibration methods using standard reference materials like NIST 612. The document also discusses data manipulation software such as GLITTER and TriPlot for visualizing results.
| Laser Wavelength | 213 nm |
|---|---|
| Spot Size Range | <5 um to 300 um |
| Detection Limits | part per trillion (ppt) to the part per million (ppm) |
An Agilent 7500s ICP-MS.
The AutoTune function of the Agilent ChemStation software.