Agilent Cary 50 Spectrophotometer Application Note: Measuring Relative % Reflectance of Small Samples

This document describes how to measure small sample relative % reflectance using Cary 50 spectrophotometer


Agilent Cary 50 Spectrophotometer Application Note: Measuring Relative % Reflectance of Small Samples - cover page
Brand
Agilent
Document type
Application Note
Language
English
Pages
3
File format
PDF
File size
139 KB
Published
12 June, 2012
Updated
30 September, 2023
MD5 checksum
FD8534ADBAF5D8902BEB9B2CAF8A0FD2

About this manual

The document details an experiment measuring the relative % reflectance of small electro-optic devices recovered from CD drives. The setup utilizes a standard Cary 50 instrument fitted with a high precision Eclipse cell holder and the Hellma TrayCell accessory.

Measurements were performed using the instrument's standard scan software module to record a baseline (100%R) against the TrayCell standard mirror or an alternative calibrated reference mirror. Results demonstrate that this combination provides acceptable precision for small samples difficult to measure with conventional reflectance accessories, showing a measured variance of about 0.4% on a narrow peak.

What's inside

  • Introduction
  • Instrumentation
  • Conditions
  • Results
  • Discussion

Frequently asked questions

What specific samples were tested in this application note?

The document tested small electro-optic devices recovered from CD drives, specifically beamsplitters.

What is the maximum measured variance for the coated beamsplitter sample?

The measured variance was about 0.4% Reflectance on the narrow 438 nm peak.

What wavelength range does the setup screen allow for scanning?

The software allows setting a start wavelength of 200 nm and a stop wavelength of 2000 nm.

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