This paper mainly introduces the method of measuring selenium in serum by xenon lamp fluorescence spectroscopy. The method is improved, using xenon lamp fluorescence spectroscopy technology to detect selenium in serum at 196.0nm, and to detect background at 192.6nm. The background and sample spectra are scanned, and the concentration of selenium in serum is obtained by comparing the calculations. The detection limit of this method is 0.04μg/L.
This document details a method for measuring trace selenium levels in neonatal serum samples using the Agilent SpectrAA-880 Zeeman graphite furnace atomic absorption spectrometer. The study addresses challenges such as molecular absorption in the far UV region and atomization problems in complex sample matrices by utilizing Zeeman background correction, boosted discharge lamps, and specific chemical modifiers like palladium.
The procedure outlines the preparation of reagents, including sample diluent and modifiers, as well as the setup of the autosampler and instrument parameters. It provides a standard addition dilution scheme and furnace program settings to ensure accuracy and precision, reporting results with a coefficient of variation of approximately 4%.
| Element | Se |
|---|---|
| Sample Volume | 20 pL |
| Furnace Temperature | 2550 °C |
An Agilent SpectrAA-880 Zeeman graphite furnace atomic absorption spectrometer is used.
Samples should be diluted 1:10 with sample diluent to maintain modifier levels and ensure accurate delivery.
Palladium is used as a modifier, prepared at 500 mg/L with Triton X-100 and Antifoam B.