Agilent Cary 6000i Low Reflectance Measurements Using the VW Technique Application Note

Application Note for low reflectance measurement using the ‘VW’ technique


Agilent Cary 6000i Low Reflectance Measurements Using the VW Technique Application Note - cover page
Brand
Agilent
Document type
Application Note
Language
English
Pages
4
File format
PDF
File size
191 KB
Published
11 June, 2012
Updated
30 September, 2023
MD5 checksum
2F2F15FCB290E29E107FA94E8A97ABEA

About this manual

This document describes how to perform accurate low-reflectance measurements on thin film anti-reflection (AR) coatings using the 'VW' absolute specular reflectance accessory. The method utilizes a high-performance Agilent Cary 6000i UV-Vis-NIR spectrophotometer equipped with an InGaAs detector.

What's inside

  • Introduction
  • Instrumentation
  • Operational parameters
  • Reference spectrum
  • Near-normal reflectance measurements of low-R samples

Frequently asked questions

What is the maximum scan time required to acquire the spectra presented in this report?

The maximum scan time for any of the spectra presented was less than 3 minutes.

What scan rate was used to acquire the UV-Vis-NIR spectra in this application?

The spectra were acquired using a scan rate of 60 nm/min.

What is the operating wavelength range of the lead sulphide photocell used in the Cary 5000?

The lead sulphide photocell has a wide operating range from 750-3300 nm.

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