Application Note for low reflectance measurement using the ‘VW’ technique
This document describes how to perform accurate low-reflectance measurements on thin film anti-reflection (AR) coatings using the 'VW' absolute specular reflectance accessory. The method utilizes a high-performance Agilent Cary 6000i UV-Vis-NIR spectrophotometer equipped with an InGaAs detector.
The maximum scan time for any of the spectra presented was less than 3 minutes.
The spectra were acquired using a scan rate of 60 nm/min.
The lead sulphide photocell has a wide operating range from 750-3300 nm.