SN54AHCT00 and SN74AHCT00 are quadruple 2-input positive NAND gates. They are fabricated using the EPIC (Enhanced-Performance Implanted CMOS) process and have TTL-voltage compatible inputs. The devices exhibit latch-up performance exceeding 250 mA per JESD 17 and ESD protection exceeding 2000 V per MIL-STD-883. They are available in various package options.
The document provides detailed specifications for the SN54AHCT00 and SN74AHCT00 CMOS quadruple 2‑input positive‑NAND gate families. It includes package options, absolute maximum ratings, recommended operating conditions, electrical and noise characteristics, and a legal notice.
Key sections cover supply and input voltage ranges, output current capabilities, temperature limits, ESD protection, and timing parameters, allowing designers to evaluate suitability for their circuits.
| Supply voltage range | 4.5 V – 5.5 V |
|---|---|
| Input voltage range | 0 V – 5.5 V |
| Operating temperature range (SN54AHCT00) | ‑55 °C – 125 °C |
| ESD protection rating | exceeds 2000 V |
| Latch‑up performance | exceeds 250 mA |
The devices operate with a supply voltage between 4.5 V and 5.5 V.
SN54AHCT00 is rated from –55 °C to 125 °C, while SN74AHCT00 is rated from –40 °C to 85 °C.
The devices provide ESD protection exceeding 2000 V.