AT93C56A/66A (AT3552m/2k) SPI EEPROM Product Qualification report summarizes the product level qualification data, ESD, Latchup, and Write Endurance for the AT93C56A/66A Serial EEPROM. This data, in conjunction with the AT35000 Process Qualification and Reliability Report, qualifies the AT93C56A/66A.
The handbook summarizes the product‑level qualification data for the AT93C56A/66A serial EEPROM, including ESD, latch‑up, and write‑endurance characterizations. All tests were performed at Atmel’s Colorado Springs facility and follow JEDEC and MIL‑STD methods.
Test conditions include a 25 °C ambient temperature, a 5 V supply for over‑current tests, and specific pulse stresses for ESD and latch‑up. The device passed the required tests with maximum trigger currents of 200 mA, trigger voltages of 7.0 V, and demonstrated up to 1,000,000 write cycles without failure.
| Test Temperature | 25 °C |
|---|---|
| Over Current Test Voltage (VCC) | 5.0 V |
| Maximum Applied Trigger Current | 200 mA |
| Maximum Applied Trigger Voltage | 7.0 V |
| Highest Passing Write Cycles | 1,000,000 cycles |
All qualification tests were conducted at 25 °C.
The latch‑up tests used a maximum trigger current of 200 mA.
The device passed up to 1,000,000 write cycles.