This application report explains each data-sheet parameter in detail, how it affects the device, and, more important, how it impacts the application. This will enable component and system-design engineers to derive the maximum benefit from TI logic devices.
The document is an application report that helps component and system‑design engineers understand the terminology, parameters, and test conditions found in Texas Instruments standard‑logic data sheets. It provides definitions, examples, and practical hints for each major section of a typical logic device data sheet.
The report is organized into sections covering a top‑level overview of the data sheet layout, detailed explanations of device description, absolute maximum ratings, recommended operating conditions, electrical and timing characteristics, switching and noise behavior, and logic‑compatibility considerations. It also includes tables of example specifications and a concluding summary.
| IOH (High‑level Output Current) | –24 mA to –32 mA |
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It lists the stress levels that, if exceeded, may cause permanent damage to the device.