TOSHIBA TC7SZ08AFE Manual

This file provides details on the TC7SZ08AFE, including its features, operating voltage range, input voltage, output voltage, input diode current, output diode current, output current, input current, power dissipation, storage temperature, lead temperature, etc.


TOSHIBA TC7SZ08AFE Manual - cover page
Brand
Toshiba
Category
Other Electronics
Document type
Datasheet
Language
English
Pages
6
File format
PDF
File size
135 KB
Published
04 January, 2012
Updated
30 September, 2023
MD5 checksum
63645E1A7475A8A0DCB02E36FA260FD6

About this manual

The TC7SZO8AFE is a CMOS digital integrated circuit that implements a 2‑input AND function. It offers high output drive up to +24 mA (min) and a typical propagation delay of 2.7 ns. The device operates from a supply voltage range of 1.8 V to 5.5 V and is designed for low‑power, high‑speed applications.

The datasheet includes absolute maximum ratings, electrical and AC characteristics, package dimensions, and important restrictions on product use. Users are advised to follow Toshiba’s Semiconductor Reliability Handbook for handling and derating recommendations, and to avoid use in safety‑critical or high‑reliability systems.

What's inside

  • Features
  • Absolute Maximum Ratings
  • Operating Ranges
  • Electrical Characteristics
  • AC Characteristics
  • Package Dimensions
  • Restrictions on Product Use

Specifications

High output drive+24 mA (min)
Propagation delay (typical)2.7 ns
Input voltage range0 V ~ 5.5 V
Output voltage range0 V ~ Vcc
Operating temperature range-40 °C ~ 85 °C
Weight0.003 g (typ.)
Power dissipation150 mW

Frequently asked questions

What is the maximum supply voltage for the TC7SZO8AFE?

The device can be supplied up to 5.5 V (absolute maximum rating).

What is the typical propagation delay of the AND gate?

The typical propagation delay is 2.7 ns.

Are there any usage restrictions for this semiconductor?

Yes, it should not be used in safety‑critical applications such as medical instruments, aerospace, or any equipment where failure could cause loss of life.

Where can I find reliability guidelines for designing with this part?

Refer to the Toshiba Semiconductor Reliability Handbook for handling precautions and derating concepts.

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