The Agilent 11757B Multipath Fading Simulator/Signature Test Set automates multipath fade testing for digital microwave radios, allowing quick signature measurements to verify adaptive equalizer performance. It simulates a simplified 3‑ray model with a precisely controlled notch, enabling both static and dynamic testing, and includes built‑in M‑Curve signature capability with an internal printer.
Designed for design labs, production floors, and field service, the instrument offers features such as fast measurement (<1 minute), low intermodulation distortion (‑50 dBc), automatic swept signatures, and optional synchronization of two units for diversity testing. Specifications cover notch frequency ranges, depth, gain, power consumption, and physical dimensions, while optional accessories and service options extend functionality.
| Notch frequency range | Standard: 40 MHz to 100 MHz |
|---|---|
| Notch depth range | 0 to 40 dB |
| Gain range | 0 to 12 dB |
| Power dissipation | <200 VA |
| Weight | 9 kg (20 lb) |
| Physical size | 213 mm × 366 mm × 460 mm |
The measurement can be completed in less than one minute.
The instrument can store up to 2000 data sets.
Dynamic sweeps can be set from 10 ms to 99.9 s.