Industrial

Applications of MAC Mode AFM in Biology, Pharmaceutical, and Other Bio-Related Industries

This paper studies the process of corrosion using scanning probe microscopy (SPM)

Manipulation of gold nanoparticles in liquids using MAC mode Atomic Force Microscopy allows for the free construction of arbitrary shaped nanostructures.

This document introduces the use of AFM probes as chemically selective biosensors with affinity probes. By attaching ligand molecules to the tips of the probes, AFM probes can be transformed into sensitive, chemically selective biosensors.

This application note thoroughly characterizes the oxygen-elimination capability of the standard environmental chamber of the Agilent 5500 AFM. The note provides measurements of liquid imaging and atomic resolution in oxygen-free environment. The well-known transition between Au (1 x 1) atomic lattice and Cu (√3 x √3) under potential deposition (UPD) structure on Au (111) surface at different electrochemical potentials is demonstrated with the in situ high-resolution capability.

This document introduces the capability of Atomic Force Microscopy (AFM) in studying the temperature and humidity control application of Polyvinyl Alcohol (PVA) surfaces. AFM can image insulating materials with atomic resolution and measure various properties of polymers and surface structures, including friction, adhesion, and viscoelasticity. AFM measurements can be performed at the molecular level. The document also discusses the influence of the environment and the history of a polymer on its morphology and material properties, as well as the effects of annealing and exceeding the glass transition temperature on polymer chains. Taking polyvinyl alcohol as an example, exceeding its glass transition temperature can give the polymer chains the mobility to migrate into more energetically favorable orientations.

This file is a personal embroidery design software system installation guide, which mainly introduces the installation steps and usage precautions.

This document describes the in-process control for Aripiprazole manufacturing using the Agilent 1120 Compact LC and Agilent TC C18(2) columns. The compact LC system is designed for easy use, high performance, and reliability, making it well-suited for in-process control in the pharmaceutical industry. The document also shows excellent retention time precision and peak area precision.

This document describes the detector linearity testing for Aripiprazole quality control using the Agilent 1120 Compact LC and Agilent TC C18(2) columns. The experimental results demonstrate excellent retention time and peak area precision, as well as outstanding linearity of the system.

The document introduces the system suitability testing for Aripiprazole quality control using Agilent 1120 Compact LC and Agilent TC C18(2) columns. The system provides highly precise retention times and peak areas, as well as low detection limits, making it suitable for drug analysis.

The Application Note describes the application of accurate mass measurement using the ESI TOF technology, and gives mean and standard deviation of repeatedly measured mass accuracies from a real-life pharmaceutical sample.

This Application Note describes the identification of pharmaceutical metabolites using the Agilent 6520 Accurate-Mass Quadrupole Time-of-Flight (Q-TOF) LC/MS system and Agilent MassHunter Metabolite Identification (MetID) software.

This article describes how to use Agilent ZORBAX Eclipse Plus Phenyl-Hexyl and StableBond Phenyl columns to separate potentially harmful azo dye amines

This document introduces Agilent Technologies' Scanning Microwave Microscope (SMM), a new Scanning Probe Microscope (SPM) that combines the electromagnetic measurement capabilities of a microwave Vector Network Analyzer (VNA) with the nanometer-resolution and Angstrom-scale positioning capabilities of an Atomic Force Microscope (AFM). Agilent VNAs are mature, highly sophisticated characterization instruments that make extremely accurate, calibrated measurements of complex-valued ratios on electromagnetic signals. This measurement capability, delivered to the apex of an AFM tip makes the SMM the only SPM in its class, enabling calibrated, traceable measurements of electrical properties such as impedance and capacitance, with the high spatial resolution.