STMicroelectronics AN2036 Application Note

This application note describes the solderability tests performed on STMicroelectronics lead-free devices, and how to form a reliable solder joint with the base material of the circuit board, using lead-free (Sn-Ag-Cu) or leaded (Sn-Pb) solder.


STMicroelectronics AN2036 Application Note - cover page
Brand
STMicroelectronics
Category
Other Electronics
Document type
Application Note
Language
English
Pages
7
File format
PDF
File size
274 KB
Published
06 August, 2012
Updated
30 September, 2023
MD5 checksum
C1A25C8D9CBFBF776B1F5D958CD7F242

About this manual

This document details the solderability tests applied to STMicroelectronics lead-free devices to ensure they form reliable solder joints with both leaded (Sn-Pb) and lead-free (Sn-Ag-Cu) solders. The devices conform to the ECOPACK specification and comply with RoHS directives.

Two primary tests are described: the "Dip and Look" test, which inspects surface coverage after dipping in molten solder, and the "Wetting Balance" test, which measures the force exerted during immersion to determine wetting time. Specific test conditions, such as aging procedures and solder temperatures, are provided for both surface mount and insertion packages.

What's inside

  • Solderability Tests
  • Dip and Look Test
  • Wetting Balance Test
  • Test Conditions
  • Solder Composition
  • Revision History

Specifications

Solder Composition Range (Lead-free)Tin 94.6 to 96.6, Silver 3.0 to 4.3, Copper 0.4 to 1.1
Solder Composition Range (SnPb)Tin 60 to 64, Lead 36 to 40
Lead-free Solder Melting Temperature245°C
Leaded Solder Melting Temperature220°C
Wetting Force Criterion0.1mN/mm within 5 seconds
Zero Cross Time CriterionLess than 3 seconds

Frequently asked questions

What is the pass criteria for the Dip and Look test?

The test is considered passed if 95% of the surface is covered with fresh solder.

Are Tin-Bismuth coated devices tested in Tin-Lead solder?

No, they are not tested because mixing them with Tin-Lead solder poses a reliability risk.

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