STMicroelectronics AN2035 Application Note

Introducing the characteristics of metal whiskers and suppression techniques in tin alloy coatings


STMicroelectronics AN2035 Application Note - cover page
Brand
STMicroelectronics
Category
Other Electronics
Document type
Application Note
Language
English
Pages
11
File format
PDF
File size
612 KB
Published
06 August, 2012
Updated
30 September, 2023
MD5 checksum
923BCC31A44A3531CEE7F68509849EFC

About this manual

The document explains the nature of whiskers, which are microscopic crystal filaments that grow spontaneously from metal surfaces like Tin, Silver, and Zinc. It identifies internal compressive stresses as the primary cause of this growth and discusses how factors such as co-deposited impurities, atomic defects, and thermal stress contribute to the problem. The text highlights the industry's shift from Lead-bearing alloys to pure Tin plating due to environmental regulations, necessitating new strategies to prevent whisker formation.

What's inside

  • Nature of whiskers
  • Whisker mitigation techniques
  • Internal stress causes
  • Bright vs Matte Tin plating
  • Intermetallic Compound growth
  • Post-bake treatment
  • Whisker assessment

Specifications

Maximum whisker length for risk-free coating50um
Post-bake temperature150°C
Post-bake duration1 hour

Frequently asked questions

What causes whisker growth in Tin coatings?

Whisker growth is mainly due to internal compressive stresses near the metal surface that reach a critical level.

How can internal stress in Tin-plated films be reduced?

Internal stress can be reduced by applying a 1-hour 150°C bake within 24 hours of plating.

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