Agilent 5500, 5400 and 5100 multipurpose scanners deliver unsurpassed performance, versatility, and ease of use for atomic force microscopy (AFM). They are ideal for imaging in fluids or air and under controlled temperature and environmental conditions. These unique top-down scanners offer many key performance benefits. To deliver high-resolution imaging results, a patented pendulum scanner design is utilized that eliminates artifacts.
This document describes the Agilent Multipurpose Scanners (models 5500, 5400, and 5100), which are designed for atomic force microscopy (AFM) and scanning probe microscopy (SPM). The scanners utilize a patented top-down configuration to protect electronics from harsh environments while allowing imaging in ambient air, controlled gases, or fluids. A key feature is the ability to switch between two scan ranges: a large scanner covering up to 90 um x 90 um and a small scanner offering atomic resolution up to 9 um x 9 um.
| Large AFM scanner scan size | 90 um x 90 um x 7 um |
|---|---|
| Small AFM scanner scan size | 9 um x 9 um x 2 um |
| Large AFM scanner noise level | <5 ARMS |
| Small AFM scanner noise level | <1 ARMS |
Samples can be imaged at temperatures up to 250° C over time periods as long as 10 hours.
The large scanner scans areas up to 90 um x 90 um, while the small scanner offers atomic resolution up to 9 um x 9 um.
The sensitivity is 10 nA/V, 1 nA/V, or 0.1 nA/V depending on the option selected.