Analog Devices AN-756 Application Note Sampled Systems and the Effects of Clock Phase Noise and Jitter

This application note discusses the effects of clock phase noise and jitter on sampled systems and recommends considering system performance and cost when selecting clock circuits.


Analog Devices AN-756 Application Note Sampled Systems and the Effects of Clock Phase Noise and Jitter - cover page
Brand
Analog Devices
Category
Other Electronics
Document type
Application Note
Language
English
Pages
12
File format
PDF
File size
292 KB
Published
04 June, 2012
Updated
30 September, 2023
MD5 checksum
9CA56AE12ED199A80A0068FE1687D316

About this manual

The note discusses the growing need for accurate clock specifications as higher‑resolution data converters become available. It explains why traditional jitter specifications are insufficient and why both wide‑band and close‑in phase‑noise characteristics must be considered when designing or selecting a clock source.

It then presents methods for estimating jitter impact on SNR, shows how phase‑modulated clock signals appear in the output spectrum, and offers practical equations and examples to predict spurious levels and overall converter performance.

What's inside

  • Abstract
  • History
  • Jitter Defined
  • Phase Noise Defined
  • Types of Noise
  • Sample Clock in the Polar Domain
  • Sample Clock in the Frequency Domain
  • Typical Sampling Circuit of an ADC
  • Effects of Phase/Frequency Modulated Sample Time
  • Aliased Wideband Noise Compared to Close‑In Phase Noise

Specifications

Clock jitter requirement for 70 MHz IF at 75 dB SNR400 femtoseconds
Encode source frequency used in example78 MSPS
Phase‑modulated sideband level in example–66 dBc

Frequently asked questions

What clock jitter is required for a 70 MHz IF signal to achieve 75 dB SNR?

A clock jitter of 400 femtoseconds is required.

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