STMicroelectronics TLPxxM/G/G-1 Handbook

The TLPxxM/G/G-1 series are tripolar transient surge arrestors used for primary and secondary protection in sensitive telecom equipment. They feature tripolar crowbar protection, voltage range selected for telecom applications, repetitive peak pulse current, holding current, low capacitance, and low leakage current.


STMicroelectronics TLPxxM/G/G-1 Handbook - cover page
Brand
STMicroelectronics
Category
Other Electronics
Document type
User Manual
Language
English
Pages
14
File format
PDF
File size
148 KB
Published
01 June, 2012
Updated
29 September, 2023
MD5 checksum
59720A876812391DE9A7091512BB9DAF

About this manual

This handbook describes the TLPxxM/G/G-1 series of tripolar transient surge arrestors used for primary and secondary protection of sensitive telecom equipment. It covers the device description, key features such as a tripolar crowbar protection, low capacitance (110 pF typ.) and low leakage current (5 pA max), and benefits like no ageing and short‑circuit fallback.

The document includes detailed electrical characteristics, absolute maximum ratings, thermal resistance data, mechanical dimensions, package markings, and recommended mounting techniques on FR‑4 and IMS substrates. Test procedures for functional holding current (GO‑NO‑GO) and breakover voltage measurements are also provided.

What's inside

  • Description
  • Features
  • Benefits
  • Electrical Characteristics
  • Absolute Maximum Ratings
  • Thermal Resistance
  • Functional Holding Current Test
  • Package Marking and Order Code
  • Mechanical Data
  • Mounting and Substrate Information

Specifications

Peak pulse current (Ipp)100 A (10 µs/1000 µs)
Holding current (In)150 mA
Capacitance (C)110 pF typ.
Leakage current (Ir)5 pA max
Breakdown voltage (VBR) – CCITT K204000 V

Frequently asked questions

What is the peak pulse current rating of the TLPxxM/G/G-1 series?

The series is rated for a peak pulse current of 100 A with a 10 µs/1000 µs waveform.

How is the functional holding current tested?

A GO‑NO‑GO test is used: the device is short‑circuited to set the holding current, then a surge of 10 A (10 µs/1000 µs) is applied and the device must turn off within 50 ms.

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