This datasheet provides the technical specifications of ABT8646, including product features, characteristics, model, brand, etc.
The SN54ABT8646 and SN74ABT8646 are scan‑test devices that integrate octal bus transceivers and registers. They belong to the Texas Instruments SCOPE™ family and support IEEE Standard 1149.1‑1990 (JTAG) boundary‑scan architecture. The devices provide parallel‑signature analysis, pseudorandom pattern generation, and other test functions while maintaining normal‑function operation.
The handbook describes pin functions, package options, functional block diagrams, TAP‑controller state machine, and mechanical dimensions. It also includes temperature specifications, boundary‑scan cell details, and legal notices from Texas Instruments.
| Operating temperature (SN54ABT8646) | ‑55 °C to 125 °C |
|---|---|
| Operating temperature (SN74ABT8646) | ‑40 °C to 85 °C |
| Package options | DW, DL, FK, JT |
| Boundary‑scan cells per I/O | 2 |
| Instruction register size | 8 bits |
| Boundary‑scan register size | 40 bits |
| Number of pins (DL package) | 48 |
It operates from ‑55 °C to 125 °C.
Two boundary‑scan cells are provided per I/O pin.
The instruction register is 8 bits wide.