This document describes the Keysight 4080 Series Parametric Test System, covering hardware, software, accessories, and professional services for…
The Keysight 4080 Series offers a total solution for fundamental parametric testing, including DC and capacitance measurements. It is available in two models: the 4082A Parametric Test System and the 4082F Flash Memory Cell Parametric Test System. The system supports various Source Monitor Units (SMUs) and offers high measurement resolution.
| Measurement Resolution | 1 fA and 0.1 µV |
|---|---|
| Operating System | Red Hat Enterprise Linux |
| HV-SPGU Output Capability | ±40 V |
Yes, it offers code compatibility of test plans and algorithms from the 4070 Series.
A standard warranty of 12 months of on-site repair service is offered.