Researchers at TDK Corporation in Japan have developed a method based on laser ablation inductively coupled plasma mass spectrometry for simultaneous quantitative analysis of major, minor, and trace elements in electroceramics. The method offers high sensitivity, spatial resolution of 10 µm, robustness, and rapid analysis.
This document details a method developed by researchers at TDK Corporation for the quantitative analysis of electroceramics using Laser Ablation Inductively Coupled Plasma Mass Spectrometry (LA-ICP-MS). The technique addresses the need for high-sensitivity, rapid analysis of solid materials as electroceramic components become smaller and thinner.
The text explains that while conventional methods like XRF and ICP-AES have limitations regarding sensitivity and sample preparation, LA-ICP-MS allows for local analysis of solids without preprocessing. The document specifically highlights the advantages of the Agilent 7500 Series ICP-MS, noting its wide linear dynamic range and detection circuit capabilities that ensure acquisition speed is not compromised when analyzing elements with widely varying concentrations.
| Analytical range | nine orders |
|---|
The method offers a spatial resolution of 10 µm.
The analysis covers a mass range from m/z 2 to 260 amu.