Agilent Vista ICP-OES is a unique instrument that can simultaneously measure the entire elemental spectrum. It has distinct advantages that can be used to analyze difficult samples with a maximum of 5% total dissolved solids and eliminate cooler tails of plasma, reduce easily ionizable element (EIE) interferences and maximize linear dynamic range.
The document presents a complete analytical method developed on the Agilent Vista simultaneous ICP-OES system with axially viewed plasma. Key features highlighted include the VistaChip CCD, RF robustness allowing analysis of difficult samples up to 5% total dissolved solids, and the Cooled Cone Interface (CCI) which reduces interferences.
The note details the optimization of instrument operating conditions and software settings such as MultiCal and Adaptive Integration to meet US EPA data quality control protocols. It provides specific instrument parameters, detection limits for various elements, and discusses the advantages of axial viewing over dual-viewed systems in terms of analysis time and cost.
| Power | 1.40 kW |
|---|---|
| Plasma gas flow | 15.0 L/min |
| Auxiliary gas flow | 0.75 L/min |
| Pump speed | 15 rpm |
The RF robustness permits analysis of difficult samples up to 5% total dissolved solids, and it eliminates the cooler tail of the plasma to reduce interferences.
It allows multiple wavelengths to be used simultaneously for the same element, automatically assigning sample results to appropriate wavelengths within the valid linear dynamic range.
The primary guiding documents used are CLP ILM0 4.0, ILM05.0, Methods 200.7 and 6010B.