Agilent Perfect Focus FT-IR Microscopy Application Brief

About this manual

This document describes the Perfect Focus technology used in Agilent FT-IR microscopes to ensure optimal sample focus. It highlights the importance of focusing specifically in the infrared region, as visible light focus does not necessarily align with infrared focus due to wavelength differences. The technology is designed to provide a precise focus using infrared radiation to optimize the signal for spectral analysis.

What's inside

• Focus in Infrared
• Coarse focus capability
• Fine focus capability
• Sample loading and unloading
• Software control panel features

Frequently asked questions

How does the PerfectFocus system handle samples with depth, such as an occlusion in plastic?

The operator focuses into the sample to bring the contaminant into sharp contrast.

What is the primary purpose of using visible radiation for focusing?

It is used to capture a record of the sample and identify locations where spectra were collected.

How does the system allow an analyst to change samples without losing focus?

By pressing keys on the computer screen, the stage lowers and raises automatically.