Analog Devices ADN2830 Continuous Wave Laser Average Power Controller Datasheet

The ADN2830 is a closed-loop controller for the average optical power of a continuous wave (CW) laser diode (LD). It provides a bias current range of 4 mA to 200 mA, a monitor photodiode current of 50µA to 1200µA, and laser fail and degrade alarms. It also supports automatic laser shutdown, ALS, full current parameter monitoring and 5 V operation. It is suitable for fiber optic communication applications.


Analog Devices ADN2830 Continuous Wave Laser Average Power Controller Datasheet - cover page
Brand
Analog Devices
Category
Other Electronics
Document type
Datasheet
Language
English
Pages
12
File format
PDF
File size
207 KB
Published
08 June, 2012
Updated
30 September, 2023
Model
ADN2830
MD5 checksum
EE92DBCA1E7349440F3491410149FDD9

About this manual

The ADN2830 provides closed-loop control of the average optical power of a continuous wave (CW) laser diode. It adjusts the laser bias current to maintain a constant back facet monitor photodiode current, ensuring stable optical output over time and temperature variations.

Key features include programmable alarms for laser fail and degradation, automatic laser shutdown capability, and full current parameter monitoring. The device operates from a 5V supply within an industrial temperature range of -40°C to +85°C.

What's inside

  • Features
  • Applications
  • General Description
  • Functional Block Diagram
  • Electrical Characteristics
  • Absolute Maximum Ratings
  • Pin Configuration
  • Control and Alarms

Specifications

Bias Current Range4 mA to 200 mA
Operating Temperature Range-40°C to +85°C
Supply Voltage5 V Operation
Package Type32-Lead LFCSP

Frequently asked questions

What is the function of the ADN2830?

The ADN2830 provides closed-loop control of the average optical power of a continuous wave laser diode after initial factory setup.

What are the two main alarms provided?

The device includes Laser FAIL and Laser DEGRADE alarms to indicate end-of-life or impending failure conditions.

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