This application note describes how to measure nanosecond 0.1% resolution settling time for wideband amplifiers.
This document addresses the challenges of verifying precision operation at high speeds in instrumentation and data acquisition systems. It defines amplifier settling time as the elapsed time from input application until the output remains within a specified error band, noting that this metric involves delay, slew, and ring times.
The text critiques traditional measurement circuits for producing misleading results due to pulse generator aberrations and oscilloscope overdrive issues. It proposes an improved conceptual circuit using a current-switching technique and a sample gate multiplier to eliminate these errors, allowing for accurate nanosecond-range settling time measurements.
| Offset Voltage | 0.2mV |
|---|---|
| Bias Current | 2A |
| DC Gain | 2500 |
| Noise Voltage | 6nV/ Hz |
| Output Current | 70mA |
| Slew Rate | 2500V/ys |
| Gain-Bandwidth | 400MHz |
| Settling Time | 9ns/0.1% |
| Supply Current | 9mA |
The L1818 Op Amp has a settling time of 9ns to 0.1% for a 5V step.
The L1818 Op amp has a settling time of 9ns to 0.1% for a 5V step.
The output can handle up to 20pF of capacitive loading at unity gain.
The input pulse generator must have a rise time of about 1 nanosecond.