Honeywell HX6356 Radiation Hardened Static RAM Datasheet

32K x 8 STATIC RAM—SOI HX6356 Aerospace Electronics


Honeywell HX6356 Radiation Hardened Static RAM Datasheet - cover page
Brand
Honeywell
Category
Other Electronics
Document type
Datasheet
Language
English
Pages
12
File format
PDF
File size
142 KB
Published
04 June, 2012
Updated
30 September, 2023
MD5 checksum
BA1C92F4576A1F969323812B6709AB5D

About this manual

The HX6356 is a 32K × 8 (32,768‑word) static RAM fabricated with Honeywell’s RICMOS™ IV silicon‑on‑insulator process. It operates from a single 5 V ±10 % supply, supports both CMOS and TTL compatible I/O, and consumes less than 15 mW per MHz in active mode. Typical read access time is 14 ns at 5 V.

Designed for harsh radiation environments, the device is hardened to a total ionizing dose of 1×10⁸ rad(Si) and a transient dose‑rate upset of 1×10⁸ rad(Si)/s. It features a soft‑error rate below 1×10⁻⁷ upsets/bit‑day, latch‑up immunity, and operates over –55 °C to +125 °C. Packaging options include 36‑lead CFP bottom‑braze and top‑braze variants.

What's inside

  • Features
  • General Description
  • Functional Diagram
  • Signal Definitions
  • Radiation Characteristics
  • Absolute Maximum Ratings
  • Recommended Operating Conditions
  • DC Electrical Characteristics
  • Read Cycle AC Timing Characteristics
  • Write Cycle AC Timing Characteristics

Specifications

Memory Capacity32K × 8 bits
Supply Voltage4.5 V – 5.5 V (single 5 V ±10 %)
Typical Power Consumption< 15 mW/MHz (active)
Read Access TimeTypical 14 ns at 5 V

Frequently asked questions

What supply voltage range does the HX6356 support?

The device operates from a single 5 V supply, with a typical range of 4.5 V to 5.5 V.

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