Agilent Vacuum Solutions for Electron Microscopy Applications

This document is about Varian Vacuum Technologies company's vacuum solutions, including Conflat® flange, VacIon® pump, Contra-Flow™ leak detector, TriScroll™ pump, MacroTorr concept in Turbo pump technology, as well as Varian's experience in supplying vacuum components to instrumentation manufacturers of focused beam systems such as Scanning Electron Microscopes (SEM) and transmission electron microscopes (TEM).


Agilent Vacuum Solutions for Electron Microscopy Applications - cover page
Brand
Agilent
Document type
Product Leaflet
Language
English
Pages
12
File format
PDF
File size
370 KB
Published
03 July, 2012
Updated
01 October, 2023
MD5 checksum
ADF7A7001A97A67D86711785945C7A7F

About this manual

Agilent Technologies, formerly Varian, Inc., provides a comprehensive range of vacuum products for focused beam systems such as Scanning Electron Microscopes (SEM) and Transmission Electron Microscopes (TEM). The document highlights the company's legacy in vacuum technology, noting that innovations like the Conflat® flange and Vaclon® pump are now industry standards.

The brochure details specific product lines tailored for electron microscopy, including SEM Turbo pumps, Integrated Double Dampers, and SEM ion pumps ranging from 0.4 l/s to 500 l/s. It also covers backing pumps, valves, and gauging systems designed to meet the low vibration and electromagnetic noise requirements of these sensitive instruments.

What's inside

  • Focused beam analytical instrumentation
  • Varian Products for SEM Systems
  • SEM Turbo and Ion Pumps
  • Valves and Backing Pumps
  • Gauging Systems
  • Service Plans
  • Vacuum Solutions for the Column
  • Application specific pumping solutions

Specifications

Controller Channels3 channel

Frequently asked questions

What companies are referenced in this document?

The document references Varian, Inc., which is now part of Agilent Technologies.

What types of systems do these vacuum solutions support?

The solutions support Scanning Electron Microscopes (SEM), Transmission Electron Microscopes (TEM), and Focused Ion Beam (FIB) tools.

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