STMicroelectronics AN1709 EMC Design Guide for ST Microcontrollers

This application note explains ST Microcontroller EMC features and compliance standards to help application designers reach the optimum level of EMC performance.


STMicroelectronics AN1709 EMC Design Guide for ST Microcontrollers - cover page
Brand
STMicroelectronics
Document type
Application Note
Language
English
Pages
38
File format
PDF
File size
662 KB
Published
16 October, 2023
Updated
16 October, 2023
Model
AN1709
MD5 checksum
C849FB6708476AF4EFD57C727F464E69

About this manual

The document addresses the increasing demand for high-performance microcontrollers, which inherently increases noise emission and sensitivity. It aims to explain how to apply EMC hardening techniques in firmware, PCB layout, and system design.

The guide covers EMC definitions, characterization of ST Microcontrollers regarding susceptibility (EMS) and interference (EMI), specific design strategies including I/O features and power management, and practical guidelines for hardware, handling, and firmware.

What's inside

  • EMC Definitions
  • Electromagnetic Susceptibility (EMS)
  • Functional ESD Test
  • Fast Transient Burst (FTB)
  • ST Severity Level & Behavior Class
  • Electromagnetic Interference (EMI)
  • ST MCU Design Strategy
  • EMC Guidelines for Applications

Specifications

Document TypeApplication Note
Document NumberAN1709/1003

Frequently asked questions

What is the purpose of this note?

This note aims to explain ST Microcontroller EMC features and compliance standards to help application designers reach the optimum level of EMC performance.

Which standard is used for the Functional ElectroStatic Discharge Test?

The F_ESD qualification test uses standards given in Table 1 as reference, specifically EN 61000-4-2 and IEC 1000-4-2.

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