STMicroelectronics AN3169 Triac Technology Performance Comparison Application Note

This document presents an experimental comparison of several Triac devices under immunity tests, as described in the IEC 61000-4-4 standard. The immunity results are discussed according to the device technology and the gate current sensitivities. A discussion about relevance of dV/dt parameter and die area is carried on to differentiate the devices in term of immunity capability. Several guidelines can then be pointed out to design high immunity appliances.


STMicroelectronics AN3169 Triac Technology Performance Comparison Application Note - cover page
Brand
STMicroelectronics
Category
Other Electronics
Document type
Application Note
Language
English
Pages
12
File format
PDF
File size
171 KB
Published
06 August, 2012
Updated
28 September, 2023
MD5 checksum
40436AC0D090BB7F4541AA283AF73156

About this manual

This document presents an experimental comparison of several Triac devices subjected to fast transient voltages as described in the IEC 61000-4-4 standard. It evaluates the immunity of different Triac technologies, including Top, Mesa, and Planar structures, specifically for applications in home appliances like washing machines and refrigerators.

What's inside

  • Triac technologies
  • Immunity tests
  • IEC 61000-4-4
  • dV/dt parameter
  • Gate current sensitivity
  • Test procedure
  • Device comparison
  • Planar technology
  • Mesa technology
  • Top technology

Frequently asked questions

What is the maximum voltage rating used for the devices compared in this application note?

The comparison was performed on devices with a voltage rating of 800 V.

What junction temperature was used to measure the dV/dt immunity results?

The dV/dt tests were performed at a 125 °C junction temperature.

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