ST AN1009 Application note handbook

This application note describes a problem that can occur with battery-powered NVRAM devices: negative undershoot can cause data corruption. This note provides advice on how to prevent this problem.

Brand: STMicroelectronics
File format: PDF
Published: 06 August, 2012
Updated: 01 October, 2023
MD5 checksum: A9028E17E2174B4615FBB193F9C3CF85
PDF: ST AN1009 Application note handbook PDF

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