Fairchild FSTU Bus Switch Undershoot Protection Application Note

This application note describes the undershoot protection circuit that prevents bus switches from turning On in response to a negative voltage spike and passing the spike to the isolated side of the device.


Fairchild FSTU Bus Switch Undershoot Protection Application Note - cover page
Brand
Fairchild
Category
Other Electronics
Document type
Application Note
Language
English
Pages
3
File format
PDF
File size
197 KB
Published
01 August, 2012
Updated
30 September, 2023
MD5 checksum
F50166D0E2B3EE008E6C17741AEDBC39

About this manual

Bus switches are commonly used for isolation and data exchange but suffer from a drawback: sensitivity to negative voltage spikes known as undershoot. These transients can cause disabled switches to turn on, leading to data corruption or system faults. Standard clamping diodes often fail to react quickly enough against these events.

The document focuses on the Fairchild Semiconductor FSTU family of bus switches, which feature a patented Undershoot Hardening Circuit (UHC). This circuit prevents the device from passing negative spikes to isolated circuits. The note details specific system conditions where this protection is critical, such as reflected wave designs (e.g., PCI buses) and systems requiring hot insertion or extraction of cards.

What's inside

  • Bus Switch Undershoot Protection
  • Reflected Wave Designs
  • Hot Insertion and Extraction
  • Pre-Charged Outputs
  • FSTU Bus Switch Family

Frequently asked questions

What causes undershoot in bus switches?

Undershoot is caused by negative input and output voltage spikes inherent to the device structure, which can cause a disabled switch to turn on.

Why do standard clamping diodes fail against undershoot?

Standard clamping diodes are designed primarily for ESD and EOS protection and will not react early enough to protect against data-corrupting undershoot events.

Which systems require undershoot protection?

Systems using reflected wave designs (like PCI) or those subjected to hot insertion and extraction frequently experience undershoot events.

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