This application note provides an overview of ST microcontrollers' EMC features and compliance standards to help application designers achieve optimum EMC performance.
This document serves as an EMC design guide specifically for ST Microcontrollers. It addresses the increasing demand for high-performance microcontrollers by explaining how noise emission and sensitivity have increased, necessitating specific hardening techniques in firmware, PCB layout, and system design.
The note details the characterization of ST microcontrollers regarding Electromagnetic Susceptibility (EMS) and Electromagnetic Interference (EMI). It covers functional tests such as ElectroStatic Discharge (ESD) and Fast Transient Burst (FTB), defines severity levels and behavior classes based on industry standards, and outlines specific design strategies including internal circuitry features like Low Voltage Detectors and I/O properties.
| Document Type | Application Note |
|---|---|
| Target Product Family | ST Microcontrollers |
This note aims to explain ST Microcontroller EMC features and compliance standards to help application designers reach the optimum level of EMC performance.
The F_ESD qualification test uses standards given in Table 1, specifically EN 61000-4-2 and IEC 1000-4-2.