Fairchild Semiconductor 1N4933-1N4937 Fast Rectifiers Datasheet

1N4933-1N4937 is a Fast Rectifiers produced by Fairchild Semiconductor Corporation. It has features of low forward voltage drop, high surge current capability, high reliability and high current capability.


Fairchild Semiconductor 1N4933-1N4937 Fast Rectifiers Datasheet - cover page
Brand
Texas Instruments
Category
Other Electronics
Document type
Datasheet
Language
Chinese
Pages
3
File format
PDF
File size
45 KB
Published
01 August, 2012
Updated
30 September, 2023
MD5 checksum
317675221B7B410BAB2EEE4604CAF889

About this manual

This document is a datasheet for the Fairchild Semiconductor 1N4933-1N4937 series of Fast Rectifiers. It details the device features, such as low forward voltage drop and high surge current capability, along with specific electrical parameters like reverse recovery time and average rectified forward current for each model variant.

The datasheet includes absolute maximum ratings, electrical characteristics at 25°C, and thermal characteristics. It also presents typical characteristic curves illustrating performance under various conditions, such as forward current derating, reverse voltage effects on capacitance, and reverse recovery time. This manual is written in Chinese.

What's inside

  • Absolute Maximum Ratings
  • Electrical Characteristics
  • Thermal Characteristics
  • Typical Characteristics
  • Features
  • Product Status Definitions
  • Disclaimer
  • Trademarks

Specifications

Forward Voltage @ 1.0 A1.2 V
Maximum Repetitive Reverse Voltage (1N4933)50 V
Storage Temperature Range-50 to +150 °C
Power Dissipation2.5 W
Thermal Resistance, Junction to Ambient50 °C/W

Frequently asked questions

What are the key features of the 1N4933-1N4937 Fast Rectifiers?

The key features include low forward voltage drop, high surge current capability, high reliability, and high current capability.

What is the maximum operating junction temperature?

The operating junction temperature range is from -50 to +150 °C.

What is the reverse recovery time for these devices?

The reverse recovery time is 150 ns under specific test conditions (IF = 0.5 A, IR = 1.0 A, Irr = 0.25 A).

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