Fairchild 74HC Logic CMOS SCR Latch-Up Elimination Application Note

This document mainly introduces Fairchild's chip process optimization solution to eliminate CMOS SCR latch-up problem in 74HC logic.


Fairchild 74HC Logic CMOS SCR Latch-Up Elimination Application Note - cover page
Brand
Fairchild
Category
Other Electronics
Document type
Application Note
Language
English
Pages
10
File format
PDF
File size
144 KB
Published
01 August, 2012
Updated
30 September, 2023
Model
74HC
MD5 checksum
D91D0D7A4FA8A7FAE14F0C762B2F4D82

About this manual

This document describes the CMOS SCR latch-up phenomenon, a parasitic effect that can cause circuits to malfunction or be destroyed. It details the mechanism involving parasitic P-N-P-N structures within bulk silicon CMOS technologies.

What's inside

  • Introduction
  • SCR Latch-Up Phenomena
  • Simple Discrete SCR Operation
  • CMOS SCR Static DC Operation
  • Process Enhancements

Frequently asked questions

What is CMOS SCR latch-up?

It is a parasitic phenomenon involving a four-layer thyristor structure (P-N-P-N) that appears from V CC to ground, causing the circuit to malfunction.

How is latch-up triggered in 74HC logic?

It is commonly triggered by applying a voltage greater than V CC or less than ground to any input or output, which forward biases the protection diodes.

How does Fairchild eliminate latch-up?

Fairchild uses proprietary innovations in CMOS processing that reduce transistor betas to eliminate the latch-up mechanism.

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