Supertex 2N7007 N-Channel Enhancement-Mode Vertical DMOS FET Datasheet

2N7007 is a N-channel enhancement-mode vertical DMOS FET produced by Supertex, which features high input impedance, low input capacitance and fast switching speeds. It is suitable for a wide range of switching and amplifying applications.


Supertex 2N7007 N-Channel Enhancement-Mode Vertical DMOS FET Datasheet - cover page
Brand
N-Channel
Category
Other Electronics
Document type
Datasheet
Language
English
Pages
2
File format
PDF
File size
15 KB
Published
12 July, 2012
Updated
30 September, 2023
MD5 checksum
94E1FF86EF607C4016A4C83B5C1EE032

About this manual

This document is a datasheet for the Supertex 2N7007, an N-Channel Enhancement-Mode Vertical DMOS FET. The device features a vertical DMOS structure and Supertex's silicon-gate manufacturing process, offering high input impedance, fast switching speeds, and excellent thermal stability. It is designed for applications such as motor controls, converters, amplifiers, and switches.

The datasheet provides comprehensive technical data including absolute maximum ratings, thermal characteristics, and electrical characteristics. Key specifications include a drain-to-source breakdown voltage of 240V, a gate threshold voltage range of 1V to 2.5V, and a continuous drain current of 65mA in a TO-92 package. The document also includes switching waveform diagrams and notes on testing conditions.

What's inside

  • Ordering Information
  • Features
  • Applications
  • Absolute Maximum Ratings
  • Advanced DMOS Technology
  • Package Options
  • Thermal Characteristics
  • Electrical Characteristics
  • Switching Waveforms

Specifications

Drain-to-Source Breakdown Voltage240 V
Gate Threshold Voltage1 to 2.5 V
Continuous Drain Current (TO-92)65mA
Operating and Storage Temperature-55°C to +150°C
Input Capacitance30 pF

Frequently asked questions

What are the applications for the 2N7007?

Applications include motor controls, converters, amplifiers, switches, and power supply circuits.

Is the 2N7007 free from secondary breakdown?

Yes, the device is free from secondary breakdown and thermally-induced secondary breakdown.

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