TESCAN MIRA3 High Performance Field Emission Scanning Electron Microscope

A high-performance field emission scanning electron microscope featuring a Schottky emitter, advanced optics, and optional detectors for high-resolution…


TESCAN MIRA3 High Performance Field Emission Scanning Electron Microscope - cover page
Brand
Tescan
Category
Other Electronics
Document type
Product Leaflet
Language
English
Pages
12
File format
PDF
File size
2.4 MB
Published
06 November, 2026
Updated
06 November, 2026
MD5 checksum
1FED2F10E41FF7F1EE0100861241B6F4

About this manual

The TESCAN MIRA3 is a high-performance field emission scanning electron microscope (SEM) designed for high-resolution and low-noise imaging. It features a high-brightness Schottky emitter and unique Wide Field Optics™ design with a proprietary Intermediate Lens (IML). The system supports various chamber sizes (LM, XM, GM) and can be configured for both low- and high-vacuum operations, including an extended low-vacuum mode up to 500 Pa for non-conductive samples.

What's inside

  • Modern Electron Optics
  • Analytical Potential
  • Rapid Maintenance
  • Automated Procedures
  • Beam Deceleration Technology
  • User-Friendly Software
  • Electron-Beam Lithography
  • Electron Channelling Pattern Acquisition
  • Channelling Scan Mode
  • Interpreting ECPs

Specifications

Vacuum operation modesLow- and high-vacuum operations
Extended low-vacuum mode pressureup to 500 Pa
Imaging rateup to 20 ns
Ultra-low landing energydown to 50 eV
Sample stage type5-axis fully motorized compucentric stage

Frequently asked questions

What is the Beam Deceleration Technology (BDT)?

BDT consists of the Beam Deceleration Mode (BDM) and an In-Beam detector to detect high-angle BSE and SE signals under standard operating conditions.

Can the MIRA3 be used for electron-beam lithography?

Yes, it can be used with the DrawBeam software and an electrostatic Beam Blanker to create features of a few nanometers.

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