A dynamic aging test system for electronic components, supporting temperature-controlled testing from room temperature to 180°C with automated performance…
This system enables dynamic aging testing of electronic components under controlled temperature environments from room temperature to 180°C. It supports automated functional and electrical parameter testing, with real-time performance evaluation and screening. The system is modular and scalable, compatible with various instruments, and includes customizable fixtures and routing matrices. It can test over 200 types of components including resistors, capacitors, inductors, diodes, and transformers, with expandable capabilities.
The system features a high-reliability, automated testing process with built-in error handling, and supports parallel testing sequences. It includes data storage, curve analysis, and report generation for test results. The system is designed for industries including electronics, defense, energy, and automotive, with applications in component quality assurance and reliability testing. This manual is written in Chinese.
| Resistance Measurement Range | 1Ω～10MΩ |
|---|---|
| Resistance Accuracy | 1% for 10Ω and below, 0.5% for 10Ω and above |
The system can test resistors, capacitors, inductors, voltage regulators, diodes, and transformers, with over 200 types supported.
Accuracy is 1% for resistances below 10Ω and 0.5% for those above 10Ω.