北京泛华恒兴科技有限公司 Manuals

Beijing Pansino Solutions Technology Co., Ltd Electronic Component Aging Test System

This system enables dynamic aging testing of electronic components under controlled temperature environments from room temperature to 180°C. It supports automated functional and electrical parameter testing, with real-time performance evaluation and screening. The system is modular and scalable, compatible with various instruments, and includes customizable fixtures and routing matrices. It can test over 200 types of components including resistors, capacitors, inductors, diodes, and transformers, with expandable capabilities.

The system features a high-reliability, automated testing process with built-in error handling, and supports parallel testing sequences. It includes data storage, curve analysis, and report generation for test results. The system is designed for industries including electronics, defense, energy, and automotive, with applications in component quality assurance and reliability testing. This manual is written in Chinese.

Covers: Electronic Component Aging Test System · Angle Displacement Sensor Test System · Gas Mass Flow Sensor Calibration System · Smart Linear Position Sensor Calibration and Test Platform · DDS Static Chip Test System · Circuit Board Test Platform