XJ4810 type semiconductor tube characteristic diagram plotter can test the static characteristics and reverse breakdown characteristics of crystal diodes, zener diodes, crystal triodes and field effect tubes, and can measure hfe, gm, Iceo and other parameters.
The XJ4810 Semiconductor Tube Characteristics Display Instrument is a test device that shows characteristic curves of diodes, Zener diodes, transistors and FETs on an oscilloscope screen and measures static parameters like hfe, gm and Iceo. It supports both NPN and PNP devices and provides adjustable polarity, step‑signal, and collector‑power‑limit settings.
The manual describes the front‑panel layout, technical specifications, operation procedure, and test examples. It explains how to set zero voltage/current, select signal polarity, adjust step‑signal levels, and perform measurements on various semiconductor types, with detailed circuit diagrams and safety notes. This manual is written in Chinese.
| Collector current range (Ic) | 10 µA/div – 0.5 A/div, ±3 % error |
|---|---|
| Base voltage/division | 0.05 V/div, ±3 % error |
| Collector voltage range (X‑axis) | 0.05 V/div – 50 V/div, ±3 % error |
| Power‑limit resistor range | 0 – 0.5 MΩ, ±10 % error |
| Supply voltage requirement | 220 V ±10 % at 50 Hz |
Use the “零电压” switch on the front panel to set the zero voltage reference.
Set the polarity switch to positive (+) for NPN transistors.
The instrument measures collector current from 10 µA/div up to 0.5 A/div.
It requires a 220 V AC supply with ±10 % tolerance at 50 Hz.