Alpha-Step IQ is a computerized and highly sensitive surface profiler that can measure roughness, waviness, and step height, with a wide range of applications.
The Alpha‑Step IQ is a computer‑controlled surface profilometer used to measure roughness, waviness and step height on a variety of materials. This manual provides an overview of the instrument, its hardware layout, and the basic principles of scanning.
Detailed instructions cover system startup, sample loading, probe handling, scan parameter settings, data analysis, calibration procedures and shutdown steps. Safety warnings and tips for preventing probe damage are included throughout. This manual is written in Chinese.
| Horizontal resolution limit | Minimum data point spacing 0.01 µm |
|---|---|
| Maximum sample size | 150 mm width, 15 mm thickness |
The Alpha‑Step IQ can accommodate samples up to 150 mm wide and 15 mm thick.