This document is about the TD-SCDMA operation guide. It introduces the testing functions, code domain measurement menu, measurement results, as well as the selection of time slots and channels. It also explains the adjustment methods of reference level and attenuator.
The guide provides step‑by‑step instructions for performing TD‑SCDMA code‑domain and frequency‑domain measurements with the Rohde & Schwarz test instrument. It describes the screen layout, hotkeys, and menu navigation needed to access measurement functions such as power, EVM, and ACLR.
Detailed procedures cover selecting slots and channels, adjusting reference level and attenuator, configuring trigger settings for burst‑mode signals, and performing multi‑carrier ACLR and spectrum emission mask tests. The document also includes background information on TD‑SCDMA frame structure and measurement conventions. This manual is written in Chinese.
| Standard chip rate | 1.28 Mcps |
|---|---|
| Chips per timeslot | 704 |
Press the [RESULTS] hotkey at the bottom of the screen to switch to the code‑domain measurement menu.
Use the sequence [RESULTS] → [SELECT] → [SELECT SLOT] and enter the slot number or adjust with the wheel.