Fudan Microelectronics VG54123L/P Leakage Protector Circuit Datasheet

The VG54123L/P is a semiconductor circuit for leakage‑protector signal amplification with wide temperature range, low power consumption and multiple package…


Fudan Microelectronics VG54123L/P Leakage Protector Circuit Datasheet - cover page
Brand
Fudan Microelectronics
Category
Other Electronics
Document type
Datasheet
Language
Chinese
Pages
7
File format
PDF
File size
232 KB
Published
06 October, 2026
Updated
06 October, 2026
MD5 checksum
7AE915BA76E4B4AB9777988FCF5AB8A2

About this manual

The VG54123L/P leakage‑protector circuit is designed for the signal‑amplification stage of high‑speed earth‑leakage protection devices. It integrates a differential amplifier, latch circuit and voltage‑regulation stage, providing high input sensitivity and strong anti‑interference capability.

The device operates from -20 °C to +80 °C, supports 110 V‑220 V supply, and is available in DIP8, SIP8 and SOP8 packages. Detailed pin descriptions, electrical parameters and application circuit diagrams are provided for designers. This manual is written in Chinese.

What's inside

  • Product Overview
  • Features
  • Functional Description
  • Pin Description
  • Electrical Parameters
  • Application Circuit
  • Version History
  • Sales and Service Locations

Specifications

Operating temperature range-20 °C ~ +80 °C
Typical input sensitivity (VT)6.1 mV
Typical power consumption5 mW
Supported supply voltage110 V ~ 220 V
Package optionsDIP8 (VG54123D), SIP8 (VG54123L), SOP8 (VG54123P)
Supply current (IS)8 mA (max)

Frequently asked questions

What is the typical input sensitivity of the VG54123L/P?

The typical input sensitivity (VT) is 6.1 mV.

What temperature range can the VG54123L/P operate in?

It operates from –20 °C to +80 °C.

Which package types are available for the VG54123L/P?

The device is offered in DIP8 (VG54123D), SIP8 (VG54123L) and SOP8 (VG54123P) packages.

What is the typical power consumption of the circuit?

Typical power consumption is 5 mW.

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